Kennedy External Micrometer 125-150mm

Enamelled frame and tungsten carbide tipped anvils. Manufactured to BS 870. Supplied in a durable plastic case. Flatness: 0.6mm. Parallelism: (2 + L/100) µm (fraction rounded down). Instrumental error: ±(1 + L/75) µm (fraction rounded up). L = maximum measuring length